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Volumn 437, Issue 1-2, 2003, Pages 127-134

Monitoring photodeposition of polymer films from diacetylene monomer solutions using in situ real-time spectroscopic ellipsometry

Author keywords

Diacetylene monomer; Photodeposition; Real time spectroscopic ellipsometry

Indexed keywords

DEPOSITION; DIELECTRIC PROPERTIES; MONOMERS; MORPHOLOGY; QUENCHING; REAL TIME SYSTEMS; SPECTROSCOPIC ANALYSIS; SUBSTRATES;

EID: 0038785684     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00677-1     Document Type: Article
Times cited : (4)

References (26)
  • 17
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    • Optical characterization techniques for semiconductor technology
    • S.S. So, R.F. Porter (Eds.), SPIE, Bellingham, WA
    • D.E. Aspnes, Optical characterization techniques for semiconductor technology, in: S.S. So, R.F. Porter (Eds.), SPIE Conference Proceedings 276, SPIE, Bellingham, WA, 1981, pp. 188-195.
    • (1981) SPIE Conference Proceedings , vol.276 , pp. 188-195
    • Aspnes, D.E.1
  • 24
    • 0038815637 scopus 로고
    • Ph.D. Thesis, the Pennsylvania State University
    • Y.-T. Kim, Ph.D. Thesis, the Pennsylvania State University, 1990.
    • (1990)
    • Kim, Y.-T.1
  • 26
    • 0003833714 scopus 로고
    • D. Bloor, & R.R. Chance. Dordrecht, The Netherlands: Martinus Nijhoff Publishers
    • Bloor D., Chance R.R. Polydiacetylenes. 1985;Martinus Nijhoff Publishers, Dordrecht, The Netherlands.
    • (1985) Polydiacetylenes


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.