Structural properties of oriented polydiacetylenes: AFM and time-resolved spectroscopy characterizations

Synthetic Metals

Volumn 81, Issue 2-3, 1996, Pages 151-154

  Da Costa, V ^a   Le Moigne, J ^a   Pham, T A ^a   Bigot, J Y ^a  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

Microscopy; Polydiacetylene; Spectroscopy; Structural properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; MORPHOLOGY; PHASE TRANSITIONS; RELAXATION PROCESSES; THIN FILMS;

COHERENT ELECTRONIC DEPHASING; DYNAMICAL MEASUREMENTS; EPITAXIAL DEPOSITION; EXCITONIC POPULATION RELAXATION; POLYDIACETYLENE; RED SHIFT; TIME RESOLVED OPTICAL SPECTROSCOPY;

POLYMERS;

EID: 0030205507     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(96)03758-7     Document Type: Article

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