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Volumn , Issue , 2003, Pages 285-288

Noise tolerant low voltage XOR-XNOR for fast arithmetic

Author keywords

Deep submicron; Multipliers; Nanometer technology; Noise tolerant; XOR XNOR circuits

Indexed keywords

ADDERS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; ENERGY UTILIZATION; MULTIPLEXING; MULTIPLYING CIRCUITS; NANOTECHNOLOGY; SPURIOUS SIGNAL NOISE;

EID: 0038714014     PISSN: 10661395     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/764867.764882     Document Type: Conference Paper
Times cited : (25)

References (10)
  • 1
    • 0035247455 scopus 로고    scopus 로고
    • Low-voltage low-power CMOS full adder
    • Fabryary
    • D. Radhakrishnan. Low-voltage Low-power CMOS Full Adder. IEE Proc.-Circuits Devices Syst., Vol 148. No. 1, Fabryary 2001.
    • (2001) IEE Proc.-Circuits Devices Syst. , vol.148 , Issue.1
    • Radhakrishnan, D.1
  • 3
    • 0022117244 scopus 로고
    • Delta-I noise specification for a high-performance computing machine
    • Sept.
    • G.A. Katopis. Delta-I noise specification for a high-performance computing machine. Proceedings of the IEEE, vol. 73, pp. 1405-1415, Sept. 1985.
    • (1985) Proceedings of the IEEE , vol.73 , pp. 1405-1415
    • Katopis, G.A.1
  • 5
    • 0028467137 scopus 로고
    • New efficient designs for XOR and XNOR functions on the transistor level
    • July
    • Jyh-Ming Wang, Sung-Chuan Fang, Wu-Shiung Feng. New Efficient Designs for XOR and XNOR Functions on the Transistor Level. IEEE J. of Solid-State Circuits, Vol. 29, No. 7, pp.780-786, July 1994.
    • (1994) IEEE J. of Solid-State Circuits , vol.29 , Issue.7 , pp. 780-786
    • Wang, J.-M.1    Fang, S.-C.2    Feng, W.-S.3
  • 9
    • 0031189144 scopus 로고    scopus 로고
    • Low-Power logic styles: CMOS versus pass-transistor logic
    • July
    • Reto Zimmermann and Wolfgang Fichtner, "Low-Power Logic Styles: CMOS Versus Pass-Transistor Logic," IEEE Journal of Solid-State Circuits, Vol 32. No. 7, pages 1079-1090, July 1997.
    • (1997) IEEE Journal of Solid-State Circuits , vol.32 , Issue.7 , pp. 1079-1090
    • Zimmermann, R.1    Fichtner, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.