SCOPUS 정보 검색 플랫폼

Praktische Metallographie/Practical Metallography

Volumn 40, Issue 4, 2003, Pages 184-192

Materials processing by focused ion beams for TEM sample preparation and nanostructuring;Materialbearbeitung mittels fokussierter ionenstrahlen zur TEM-probenpräparation und nanostrukturierung

(2) Frey, Lothar a Lehrer, Christoph b

a FIISDT (Germany)

b UNIVERSITY OF ERLANGEN NUREMBERG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DEPOSITION; ETCHING; GALLIUM; ION BEAMS; MACHINING; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; OPTICAL MICROSCOPY; REMOVAL; SAMPLING; STRUCTURE (COMPOSITION);

DEFECTIVE STRUCTURES; GALLIUM IONS; MATERIALS PROCESSING; SAMPLE PREPARATION;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0038681908 PISSN: 0032678X EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (2)

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- in press
- Frey, L.; Lehrer, C.; Ryssel, H.: Appl. Phys. A in press.
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- Frey, L.¹ Lehrer, C.² Ryssel, H.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.