메뉴 건너뛰기




Volumn 93, Issue 9, 2003, Pages 5274-5281

Ga/N flux ratio influence on Mn incorporation, surface morphology, and lattice polarity during radio frequency molecular beam epitaxy of (Ga,Mn)N

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON CYCLOTRON RESONANCE; ENERGY DISPERSIVE SPECTROSCOPY; LATTICE CONSTANTS; MANGANESE COMPOUNDS; MOLECULAR BEAM EPITAXY; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SURFACE PROPERTIES; X RAY DIFFRACTION ANALYSIS;

EID: 0038663067     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1565511     Document Type: Article
Times cited : (42)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.