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Volumn 67, Issue 5, 2003, Pages 388-394

Long-term damage induced by hadrons in silicon detectors for uses at the LHC-accelerator and in space missions

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; CURRENT DENSITY; LEAKAGE CURRENTS; PARTICLE ACCELERATORS; SEMICONDUCTOR JUNCTIONS;

EID: 0038662985     PISSN: 00318949     EISSN: None     Source Type: Journal    
DOI: 10.1238/Physica.Regular.067a00388     Document Type: Article
Times cited : (10)

References (28)
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    • edited by M. Cardona, P. Fulde and H. J. Quisser (Springer Verlag, Berlin)
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    • (1983) Springer Series in Solid State Sciences , vol.35
    • Lannoo, M.1    Bourgoin, J.2
  • 8
    • 85041879645 scopus 로고    scopus 로고
    • Preprint Fermi National Accelerator Laboratory, FN-522, 1989
    • Van Ginneken, A., Preprint Fermi National Accelerator Laboratory, FN-522, 1989.
    • Van Ginneken, A.1
  • 9
    • 0022890049 scopus 로고
    • Burke, E. A., IEEE Trans. Nucl. Sci. NS-33, 1276 (1986); Summers, G. P. et al., IEEE Trans. Nucl. Sci., NS-34, 1134 (1987); Dale, C. J., Marshall, P. W., Burke, E. A., Summers, G. P. and Wolicki, E. A., IEEE Trans. Nucl. Sci. NS-35, 1208 (1988).
    • (1986) IEEE Trans. Nucl. Sci. , vol.NS-33 , pp. 1276
    • Burke, E.A.1
  • 10
    • 0023599252 scopus 로고
    • Burke, E. A., IEEE Trans. Nucl. Sci. NS-33, 1276 (1986); Summers, G. P. et al., IEEE Trans. Nucl. Sci., NS-34, 1134 (1987); Dale, C. J., Marshall, P. W., Burke, E. A., Summers, G. P. and Wolicki, E. A., IEEE Trans. Nucl. Sci. NS-35, 1208 (1988).
    • (1987) IEEE Trans. Nucl. Sci. , vol.NS-34 , pp. 1134
    • Summers, G.P.1
  • 17
    • 85041880153 scopus 로고    scopus 로고
    • The influence of initial impurities and irradiation conditions on defect production and annealing in silicon for particle detectors
    • electronic preprint: arXiv:physics/0208027
    • Lazanu, I. and Lazanu, S. "The influence of initial impurities and irradiation conditions on defect production and annealing in silicon for particle detectors," submitted for publication to Nucl. Instr. Meth. Phys. Res. B, electronic preprint: arXiv:physics/0208027.
    • Nucl. Instr. Meth. Phys. Res. B
    • Lazanu, I.1    Lazanu, S.2
  • 18
    • 85041870163 scopus 로고    scopus 로고
    • Microscopic modelling of defects production and their annealing after irradiation in silicon for HEP particle detectors
    • presented to RESMDD, Florence
    • Lazanu, S., Lazanu, I. and Bruzzi, M., "Microscopic modelling of defects production and their annealing after irradiation in silicon for HEP particle detectors," presented to RESMDD 2002, Florence, to be published in Nucl. Instr. Meth. Phys. Res. A.
    • (2002) Nucl. Instr. Meth. Phys. Res. A.
    • Lazanu, S.1    Lazanu, I.2    Bruzzi, M.3
  • 23
    • 85041881326 scopus 로고    scopus 로고
    • The present status in microscopical modelling of defect production and their annealing due to particle irradiation in semiconductors
    • CERN, 2-4 October (unpublished)
    • Lazanu, S. and Lazanu, I., "The present status in microscopical modelling of defect production and their annealing due to particle irradiation in semiconductors," 1st RD 50 Workshop, CERN, 2-4 October 2002 (unpublished); http://www.cern.ch/rd50.
    • (2002) 1st RD 50 Workshop
    • Lazanu, S.1    Lazanu, I.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.