Applications of an Ultra High Resolution Evanescent Microwave Imaging Probe in the Nondestructive Testing of Materials

Materials Evaluation

Volumn 59, Issue 1, 2001, Pages 70-78

  Tabib Azar, M ^a  

^a Case Western Reserve University   (United States)

Author keywords

Evanescent microwaves; Material characterization; Near field imaging; Nondestructive testing; Superresolution imaging

Indexed keywords

CARRIER CONCENTRATION; ELECTROMAGNETIC FIELDS; IMAGE RESOLUTION; NONDESTRUCTIVE EXAMINATION;

EVANESCENT MICROWAVE PROBES; EVANESCENT MICROWAVES; IMAGING PROBE; MATERIALS CHARACTERIZATION; MICROWAVE IMAGING; NEAR FIELD IMAGING; NONDESTRUCTIVE TESTING OF MATERIALS; SPATIAL RESOLUTION; SUPER RESOLUTION IMAGING; ULTRAHIGH RESOLUTION;

PROBES;

EID: 0038651639     PISSN: 00255327     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

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