MICROWAVE SCANNING MICROSCOPY FOR PLANAR STRUCTURE DIAGNOSTICS.

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 1987, Pages 281-284

  Gutmann, Ronald J ^a   Borrego, Jose M ^a   Chakrabarti, Prabhansu ^a   Wang, Ming Shan ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRIP DEVICES - MEASUREMENTS; MICROWAVE MEASUREMENTS; WAVEGUIDE COMPONENTS;

CRITICALLY-COUPLED ONE-PORT CAVITIES; LOW-POWER X-BAND INSTRUMENTATION; PLANAR STRUCTURE DIAGNOSTICS;

MICROSCOPIC EXAMINATION;

EID: 0023210643     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/mwsym.1987.1132384     Document Type: Conference Paper

References (5)