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Volumn 70, Issue 7, 1999, Pages 3083-3086
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Evanescent microwave probes on high-resistivity silicon and its application in characterization of semiconductors
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001555409
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1149871 Document Type: Article |
Times cited : (30)
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References (15)
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