X-ray diffraction determination of the interface structure of CdSe/BeTe superlattices

Journal of Physics D: Applied Physics

Volumn 36, Issue 10 A, 2003, Pages

  Kyutt, R N ^a   Shubina, T V ^a   Sorokin, S V ^a   Solnyshkov, D D ^a   Ivanov, S V ^a   Willander, M ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b UNIVERSITY OF GOTHENBURG   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

BERYLLIUM COMPOUNDS; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; MONOLAYERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR GROWTH; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

BERYLLIUM TELLURIDE SUPERLATTICES; CADMIUM SELENIDE SUPERLATTICES; GALLIUM ARSENIDE SUBSTRATE;

SEMICONDUCTOR SUPERLATTICES;

EID: 0038621828     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/10A/334     Document Type: Article

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