Kinematic versus dynamic approaches of x-ray diffraction simulation. Application to the characterization of InGaAs/InGaAlAs multiple quantum wells

Journal of Applied Physics

Volumn 79, Issue 5, 1996, Pages 2332-2336

  Idiart Alhor, E ^a   Marzin, J Y ^a   Quillec, M ^a   Le Roux, G ^a   Patriarche, G ^a  

^a ORANGE LABS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037697432     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361159     Document Type: Article

References (8)

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5. R. W. James, The Optical Principles of the Diffraction of X-Rays (Cornell University Press, Ithaca, 1965).
6. S. Takagi, Acta. Cryst. 15, 1311 (1962).
7. D. Taupin, Bull. Soc. Fr. Mineral. Cristallogr. 87, 469 (1964).
8. J. Y. Marzin and J. M. Gérard, Semiconductors and Semimetals (Wiley, New York, 1990), Vol. 32.