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Volumn 28, Issue 4, 1995, Pages A154-A158
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Measurement of interface roughness in a superlattice of delta-barriers of al in gaas using high-resolution x-ray diffractometry
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION;
GALLIUM ARSENIDE;
GRADING;
INTERFACES (MATERIALS);
LASER OPTICS;
MOLECULAR BEAM EPITAXY;
MONOLAYERS;
SEMICONDUCTING GALLIUM;
SILICON;
STRAIN MEASUREMENT;
SUPERLATTICES;
BRAGG REFLECTION;
DELTA-DOPING;
DEPTH RESOLUTION;
DEVICE APPLICATION;
DYNAMICAL SIMULATION;
HIGH-RESOLUTION X-RAY DIFFRACTOMETRY;
INTERFACE ROUGHNESS;
SUPER-LATTICE STRUCTURES;
X RAY DIFFRACTION ANALYSIS;
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EID: 3042976075
PISSN: 00223727
EISSN: 13616463
Source Type: Journal
DOI: 10.1088/0022-3727/28/4A/030 Document Type: Article |
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Times cited : (9)
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References (12)
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