Excitons as a probe of interface morphology in Cd(Zn)Se/ZnSe heterostructures

Applied Surface Science

Volumn 166, Issue 1, 2000, Pages 278-283

  Toropov, A A ^a   Shubina, T V ^a   Sorokin, S V ^a   Kyutt, R N ^a   Ivanov, S V ^a   Pozina, G R ^b   Bergman, J P ^b   Monemar, B ^b   Karlsteen, M ^c   Willander, M ^c  

^a IOFFE INSTITUTE   (Russian Federation)

^b LINKÖPING UNIVERSITY   (Sweden)

^c CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; INSERTION LOSSES; INTERFACES (MATERIALS); MONOLAYERS; MORPHOLOGY; PHOTOLUMINESCENCE; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; SUPERLATTICES; X RAY DIFFRACTION ANALYSIS;

EXCITONIC SPECTRUMS;

HETEROJUNCTIONS;

EID: 0034301319     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00407-4     Document Type: Article

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