Fundamental differences between micro- and nano-Raman spectroscopy

Journal of Microscopy

Volumn 202, Issue 1, 2001, Pages 142-147

  Ayars, E J ^a   Jahncke, C L ^a   Paesler, M A ^a,c   Hallen, H D ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b ST LAWRENCE UNIVERSITY   (United States)

^c Walla Walla College   (United States)

Author keywords

Infra red spectroscopy; Near field optical microscopy; Raman spectroscopy

Indexed keywords

ELECTRIC FIELDS; INCIDENT LIGHT; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE; POLARIZATION;

ELECTRIC-FIELD-POLARIZATION; FIELD GRADIENT; INFRA RED SPECTROSCOPY; MICRO RAMAN SPECTROSCOPY; MICRO-RAMAN; MICRO/NANO; NEAR FIELD OPTICAL MICROSCOPY; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; POLARIZATION GRADIENTS; POLARIZATION ORIENTATION;

RAMAN SPECTROSCOPY;

COMPARATIVE STUDY; CONFERENCE PAPER; ELECTRIC FIELD; INFRARED SPECTROSCOPY; LIGHT SCATTERING; POLARIZATION; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; TECHNIQUE;

EID: 0035028374     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00878.x     Document Type: Conference Paper

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