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Volumn 82, Issue 1-4, 2000, Pages 279-288

Tapping-mode atomic force microscopy on intact cells: Optimal adjustment of tapping conditions by using the deflection signal

Author keywords

Atomic force microscopy; Cytoskeleton; Imaging; Methods and techniques

Indexed keywords

CELL MEMBRANES; FEEDBACK; MEDICAL IMAGING; SURFACE TOPOGRAPHY;

EID: 0033968281     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00137-0     Document Type: Article
Times cited : (62)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.