Near edge X-ray absorption fine structure characterization of polycrystalline GaN grown by nitridation of GaAs (001)

Journal of Applied Physics

Volumn 86, Issue 1, 1999, Pages 209-213

  Lubbe M ^a   Bressler, P R ^b   Braun, W ^b   Kampen, T U ^a   Zahn, D R T ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ANISOTROPY; CRYSTAL MICROSTRUCTURE; ELECTROMAGNETIC WAVE POLARIZATION; MOLECULAR BEAM EPITAXY; MONOCHROMATORS; PHASE COMPOSITION; POLYCRYSTALLINE MATERIALS; SENSITIVITY ANALYSIS; SUBSTRATES; SYNCHROTRON RADIATION; THIN FILMS;

CONSTANT LENGTH ROWLAND CIRCLE MONOCHROMATORS (CL-RCM); NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS) SPECTROSCOPY;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0032607023     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370791     Document Type: Article

References (18)

1. S. Nakamura and G. Fasol, The Blue Laser Diode (Springer, Berlin, 1997).
2. S. Yoshida, M. Sasaki, and H. Kawanishi, J. Cryst. Growth 136, 37 (1994).
3. L. A. DeLouise, J. Vac. Sci. Technol. A 10, 1637 (1992).
4. H. D. Jung, N. Kumagai, T. Hanada, Z. Zhu, T. Yao, T. Yasuda, and K. Kimura, J. Appl. Phys. 82, 4684 (1997).
5. H. Sugiyama, M. Shinohara, and K. Wada, Appl. Surf. Sci. 117/118, 546 (1997).
6. T. Makimoto and N. Kobayashi, Appl. Surf. Sci. 100/101, 403 (1996).
7. I. Aksenov, Y. Nakada, and H. Okumara, J. Appl. Phys. 84, 3159 (1998).
8. K. Uwai, Y. Yamamauchi, and N. Kobayashi, Appl. Surf. Sci. 100/101, 412 (1996).
9. T. Sukegawa, H. Katsuno, S. Kawaguchi, M. Kimura, and A. Tanaka, Appl. Surf. Sci. 117/118, 536 (1997).
10. S. Gwo, H. Tokumoto, and S. Miwa, Appl. Phys. Lett. 71, 362 (1997).
11. A. Masuda, Y. Yonezawa, A. Moromoto, and T. Shimzu, Jpn. J. Appl. Phys., Part 1 34, 1075 (1995).
12. J. Stöhr, NEXAFS Spectroscopy (Springer, Berlin, 1992).
13. D. R. T. Zahn, Appl. Surf. Sci. 123/124, 276 (1998).
14. O. Schwarzkopf, BESSY annual Report, 1997, p. 497.
15. M. Katsikini, E. C. Paloura, and T. D. Moustakas, J. Appl. Phys. 83, 1437 (1998).
16. Y.-N. Xu and W. Y. Ching, Phys. Rev. B 48, 4335 (1993).
17. A. Kikuchi, H. Hoshi, and K. Kishino, Jpn. J. Appl. Phys., Part 1 33, 688 (1994).
18. J. Stöhr and R. Jaeger, Phys. Rev. B 26, 4111 (1982).