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Volumn 13, Issue 4, 2003, Pages

High temperature degradation of Pt/Ti electrodes in micro-hotplate gas sensors

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CHEMICAL SENSORS; DEGRADATION; ELECTRODES; FINITE ELEMENT METHOD; HIGH TEMPERATURE EFFECTS; TITANIUM;

EID: 0038441771     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/13/4/320     Document Type: Conference Paper
Times cited : (37)

References (12)
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  • 2
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    • A substrate for thin film gas sensors in microelectronic technology
    • Dibbern U 1990 A substrate for thin film gas sensors in microelectronic technology Sensors Actuators B 2 63.
    • (1990) Sensors Actuators B , vol.2 , pp. 63
    • Dibbern, U.1
  • 3
    • 0031223156 scopus 로고    scopus 로고
    • Thermal and mechanical aspects for designing micromachined low power gas sensors
    • Götz A, Gràcia I, Canè C and Lora-Tamayo E 1997 Thermal and mechanical aspects for designing micromachined low power gas sensors J. Micromech. Microeng. 7 247-9.
    • (1997) J. Micromech. Microeng. , vol.7 , pp. 247-249
    • Götz, A.1    Gràcia, I.2    Canè, C.3    Lora-Tamayo, E.4
  • 6
    • 0038138368 scopus 로고    scopus 로고
    • Ongoing research in the NanoMechanicsLab Berlin-Adlershof
    • Maui, USA
    • Vogel D, Gollhart A and Michel B 2001 Ongoing research in the NanoMechanicsLab Berlin-Adlershof Proc. IEEE-NANO 2001 (Maui, USA).
    • (2001) Proc. IEEE-NANO 2001
    • Vogel, D.1    Gollhart, A.2    Michel, B.3
  • 7
    • 0030288653 scopus 로고    scopus 로고
    • MICRODAC- a novel approach to measure in situ deformation fields of microscopic scale
    • Vogel D, Schubert A, Faust W, Dudek R and Michel B 1996 MICRODAC- a novel approach to measure in situ deformation fields of microscopic scale Microelectron. Reliab. 36 1939-42.
    • (1996) Microelectron. Reliab. , vol.36 , pp. 1939-1942
    • Vogel, D.1    Schubert, A.2    Faust, W.3    Dudek, R.4    Michel, B.5
  • 9
    • 0033703994 scopus 로고    scopus 로고
    • Formation of hillocks in Pt/Ti electrodes and their effects on short phenomena of PZT films deposited by reactive sputtering
    • Nam H J, Choi D K and Lee W J 2000 Formation of hillocks in Pt/Ti electrodes and their effects on short phenomena of PZT films deposited by reactive sputtering Thin Solid Films 371 264-71.
    • (2000) Thin Solid Films , vol.371 , pp. 264-271
    • Nam, H.J.1    Choi, D.K.2    Lee, W.J.3
  • 11
    • 0029344598 scopus 로고
    • Microstructures and interdiffusions of Pt/Ti electrodes with respect to annealing in the oxygen ambient
    • Park K H, Kim C Y, Jeong Y W, Kwon H J, Kim K Y, Lee J S and Kim S T 1995 Microstructures and interdiffusions of Pt/Ti electrodes with respect to annealing in the oxygen ambient J. Mater. Res. 10 1790-4.
    • (1995) J. Mater. Res. , vol.10 , pp. 1790-1794
    • Park, K.H.1    Kim, C.Y.2    Jeong, Y.W.3    Kwon, H.J.4    Kim, K.Y.5    Lee, J.S.6    Kim, S.T.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.