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Volumn 255, Issue 1-2, 2003, Pages 19-26

Nanopipes and their relationship to the growth mode in thick HVPE-GaN layers

Author keywords

A1. Structural defects; A1. Transmission electron microscopy; A3. Hydride vapor phase epitaxy; B1. Gallium nitride; B1. Nanopipes

Indexed keywords

CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); MICROMETERS; NANOSTRUCTURED MATERIALS; NUCLEATION; REACTION KINETICS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; VAPOR PHASE EPITAXY;

EID: 0038408710     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)01190-4     Document Type: Article
Times cited : (19)

References (14)
  • 1
    • 0036132379 scopus 로고    scopus 로고
    • Defects and diffusion in semiconductors IV
    • Trans Tech Publications, in: D.J. Fisher (Ed.)
    • T. Paskova, E. Valcheva, B. Monemar, Defects and diffusion in Semiconductors IV, (Trans Tech Publications, 2002), in: D.J. Fisher (Ed.), Vol. 200-202, Defect and Diffusion Forum, pp. 1-28.
    • (2002) Defect and Diffusion Forum , vol.200-202 , pp. 1-28
    • Paskova, T.1    Valcheva, E.2    Monemar, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.