Micromechanical detectors for ferromagnetic resonance spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4176, Issue 1, 2000, Pages 84-95

  Moreland, John ^a   Kabos, Pavel ^a   Jander, Albrecht ^a   Löehndorf, Markus ^b   McMichael, Robert ^c   Lee, Chan Gyu ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR   (Germany)

^c National Institute of Standard and Technology   (United States)

Author keywords

Atomic force microscope (AFM); Bimaterial calorimeter; Ferromagnetic resonance (FvW); M H loops; MEMS; Micromechanical detector; Microwave instrumentation; Torque magnetometer

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALORIMETRY; FERROMAGNETIC RESONANCE; MAGNETIC THIN FILMS; MAGNETOMETERS; SPECTROSCOPIC ANALYSIS;

BIMATERIAL CALORIMETERS; FERROMAGNETIC RESONANCE (FMR) SPECTROSCOPY; TORQUE MAGNETOMETERS;

MICROELECTROMECHANICAL DEVICES;

EID: 0034538809     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.395644     Document Type: Article

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