Microcantilever torque magnetometry of thin magnetic films

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 5995-5997

  Löhndorf, Markus ^a   Moreland, John ^a   Kabos, Pavel ^a   Rizzo, Nick ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037662601     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372591     Document Type: Article

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