Melt-drawn scanning near-field optical microscopy probe profiles

Journal of Applied Physics

Volumn 80, Issue 9, 1996, Pages 4804-4812

  Williamson, R L ^a   Miles, M J ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000196480     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363521     Document Type: Article

References (20)

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