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Volumn 211, Issue 1-4, 2003, Pages 250-258

Preoxidation of the Cu layer in direct bonding technology

Author keywords

Direct bonded copper (DBC); Interface; Oxidation film; Preoxidation

Indexed keywords

ALUMINA; BONDING; CERAMIC MATERIALS; COMPOSITION EFFECTS; EUTECTICS; METAL MELTING; OXIDATION; OXYGEN; PHASE DIAGRAMS; THERMAL EFFECTS;

EID: 0038215549     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00243-5     Document Type: Article
Times cited : (30)

References (16)
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  • 2
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  • 4
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    • Influence of AlN intergranular phases on wetting and bonding between copper and aluminum nitride
    • Joyeux T., Jarrige J., Labbe J.C.et al. Influence of AlN intergranular phases on wetting and bonding between copper and aluminum nitride. Key Eng. Mater. 206-213:2001;555-558.
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    • Joyeux T., Jarrige J., Labbe J.C.et al. Oxygen influence on wetting and bonding between copper and aluminum nitride. Key Eng. Mater. 206-213:2001;535-538.
    • (2001) Key Eng. Mater. , vol.206-213 , pp. 535-538
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    • Thermal analysis of power cycling effects on high power IGBT modules by the boundary element method
    • Khatir Z., Lefebvre S. Thermal analysis of power cycling effects on high power IGBT modules by the boundary element method. Annu. IEEE Semicond. Therm. Measurement Manag. Symp. 20-22:2001;27-34.
    • (2001) Annu. IEEE Semicond. Therm. Measurement Manag. Symp. , vol.20-22 , pp. 27-34
    • Khatir, Z.1    Lefebvre, S.2
  • 12
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    • Challenge of bonding metals to ceramics
    • Intrater. James
    • Intrater. James, Challenge of Bonding Metals to Ceramics, Machine Design, vol. 61 (24), 1989, pp. 95-100.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.