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Volumn 4, Issue , 2001, Pages 1955-1960

Thermal and electrical ageing of DBC substrates

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRIC FIELD EFFECTS; LEAKAGE CURRENTS; SUBSTRATES; THERMAL CYCLING; THERMAL EFFECTS;

EID: 0034795469     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (6)
  • 1
    • 0033326881 scopus 로고    scopus 로고
    • Localisation of electrical-insulation- and partial-discharge failures of IGBT modules
    • (1999) IEEE , pp. 1453-1458
    • Mitic, G.1    Lefranc, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.