Characterization of the structure of porous germanium layers by high-resolution X-ray diffractometry

Crystallography Reports

Volumn 48, Issue 2, 2003, Pages 326-334

  Lomov, A A ^a   Bushuev, V A ^b   Karavanskii V A ^c   Bayliss, S ^d  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

^c PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

^d DE MONTFORT UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; HYDROGEN;

ARTICLE; ATMOSPHERE; CRYSTAL STRUCTURE; MORPHOLOGY; OPTICAL RESOLUTION; POROSITY; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0037906388     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1564216     Document Type: Article

References (16)

1. A. M. Afanas'ev, P. A. Aleksandrov, and R. M. Imamov, X-Ray Diffraction Diagnostics of Submicron Layers (Nauka, Moscow, 1989).
2. V. Holy, U. Pietsch, and T. Baumbach, High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer, Berlin, 1999).
3. P. A. Aleksandrov, A. M. Afanas'ev, and M. K. Melkonyan, Kristallografiya 26 (6), 1275 (1981) [Sov. Phys. Crystallogr. 26, 725 (1981)].
4. P. A. Aleksandrov, A. A. Zav'yalova, and A. A. Lomov, Kristallografiya 29 (4), 652 (1984) [Sov. Phys. Crystallogr. 29, 386 (1984)].
5. D. Bellet, G. Dolino, M. Ligeon, et al., J. Appl. Phys. 71 (1), 145 (1992).
6. A. A. Lomov, D. Bellet, and G. Dolino, Phys. Status Solidi B 190 (2), 219 (1995).
7. M. Binder, T. Edelmann, T. H. Metzger, and J. Peisl, Solid State Commun. 100 (1), 13 (1996).
8. D. Buttard, G. Dolino, D. Bellet, and T. Baumbach, Mater. Res. Soc. Symp. Proc. 452, 437 (1997).
9. V. A. Karavanskiǐ, A. A. Lomov, E. V. Rakova, et al., Poverkhnost, No. 12, 32 (1999).
10. A. A. Lomov, V. A. Bushuev, and V. A. Karavanskiǐ, Kristallografiya 45 (5), 915 (2000) [Crystallogr. Rep. 45, 842 (2000)].
11. V. A. Karavanskii, A. A. Lomov, V. A. Bushuev, et al., Phys. Status Solidi B (2003) (in press).
12. J. R. Heath, J. J. Shiang, and A. P. Alivisatos, J. Chem. Phys. 101 (6), 1607 (1994).
13. Y. M. Niquet, G. Allan, C. Delerue, and M. Lannoo, Appl. Phys. Lett. 77 (8), 1182 (2000).
14. A. E. Voloshin, A. A. Lomov, T. Nishinaga, et al., J. Cryst. Growth 236 (3), 501 (2002).
15. A. A. Darhuber, J. Stangl, V. Holy, et al., Thin Solid Films 306 (2), 198 (1997).
16. V. I. Iveronova and G. P. Revkevich, Theory of X-Ray Scattering (Mosk. Gos. Univ., Moscow, 1978).