Study of surface and interface roughnesses in porous silicon by high-resolution X-ray methods

Kristallografiya

Volumn 45, Issue 5, 2000, Pages 915-920

  Lomov, A A ^a   Bushuev, V A ^a   Karavanskii V A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010240481     PISSN: 00234761     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)

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