SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 737, Issue , 2003, Pages 283-288

Quantitative charge imaging of silicon nanocrystals by atomic force microscopy

(2) Feng, Tao a Atwater, Harry A b

a California Institute of Technology (United States)

b HARVARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRON TRAPS; ELECTROSTATICS; NANOSTRUCTURED MATERIALS; NONVOLATILE STORAGE; POISSON EQUATION; SILICA; VAN DER WAALS FORCES;

ELECTROSTATIC FORCE MICROSCOPY; QAUNTITATIVE CHARGE IMAGING; TRAPPED CHARGES;

SEMICONDUCTING SILICON;

EID: 0037811797 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (1)

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