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Volumn , Issue , 2003, Pages 1550-1558

RF evaluation of low-cost leadless packages and development of distributed electrical models

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; COMPUTER SIMULATION; DIES; ENCAPSULATION; INSERTION LOSSES; MATHEMATICAL MODELS; MULTICHIP MODULES; PERMITTIVITY; SEMICONDUCTING SILICON;

EID: 0037674330     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (11)
  • 1
    • 0037737184 scopus 로고    scopus 로고
    • http://www.amis.com/pdf/nqfp.pdf
  • 4
    • 0031249821 scopus 로고    scopus 로고
    • Development of microwave package models utilizing on-wafer characterization techniques
    • Oct.
    • Carl Chun, Anh-Vu Pham, Joy Laskar and Brian Hutchison, "Development of Microwave Package Models Utilizing On-Wafer Characterization Techniques", IEEE Transactions on Microwave Theory and Techniques, Vol. 45, Issue 10, Part 2, pp. 1948-1954, Oct. 1997.
    • (1997) IEEE Transactions on Microwave Theory and Techniques , vol.45 , Issue.10 PART 2 , pp. 1948-1954
    • Chun, C.1    Pham, A.-V.2    Laskar, J.3    Hutchison, B.4
  • 6
    • 4244173043 scopus 로고    scopus 로고
    • Measurement, modelling and design of monolithic and thin -film microwave integrated circuits
    • Ph.D. thesis, K.U. Leuven, May
    • Geert Carchon, "Measurement, Modelling and Design of Monolithic and Thin -Film Microwave Integrated Circuits", Ph.D. thesis, K.U. Leuven, May 2001.
    • (2001)
    • Carchon, G.1
  • 10
    • 0002083650 scopus 로고    scopus 로고
    • Multi-layer thin-film MCM-D for the integration of high performance wireless front-end systems
    • Feb
    • G. Carchon, P. Pieters, K. Vaesen, W. De Raedt, B. Nauwelaers and E. Beyne, "Multi-Layer Thin-Film MCM-D for the Integration of High Performance Wireless Front-end Systems", Microwave Journal, Vol. 44, Issue 2, pp. 96-110, Feb 2001.
    • (2001) Microwave Journal , vol.44 , Issue.2 , pp. 96-110
    • Carchon, G.1    Pieters, P.2    Vaesen, K.3    De Raedt, W.4    Nauwelaers, B.5    Beyne, E.6
  • 11
    • 0038413172 scopus 로고    scopus 로고
    • http://www.emersoncuming.com/YourSolution/ProductDetails.jsp?i=998


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.