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Volumn 2002-January, Issue , 2002, Pages 63-66

Distributed circuit models for near-CSP interconnects

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT THEORY; ELECTRONICS PACKAGING;

EID: 84948763675     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPEP.2002.1057884     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 3
    • 0031329484 scopus 로고    scopus 로고
    • A novel electrical characterization process-application on plastic BGA packages
    • San Jose, CA, May 18-21
    • C.Y. Chung, "A Novel Electrical Characterization Process-Application on Plastic BGA Packages", Proc. 47'IEEE ECTC, San Jose, CA, May 18-2 1, pp. 304-309, 1997.
    • (1997) Proc. 47'th IEEE ECTC , pp. 304-309
    • Chung, C.Y.1
  • 5
    • 0034838073 scopus 로고    scopus 로고
    • Modelling and characterisation of the polymer stud grid array (psga) package: Electrical, thermal and thermo-mechanical qualification
    • Orlando, FL, May 29-June 1
    • A. Chandrasekhar, B. Vandevelde, E. Driessens, P. Pieters, E. Beyne, W. De Raedt, B. Nauwelaers and J. Van Puymbroeck, "Modelling and Characterisation of the Polymer Stud Grid Array (PSGA) Package: Electrical, Thermal and Thermo-mechanical Qualification", Proc. SI" IEEE ECTC, Orlando, FL, May 29-June 1, pp.141-148,2001.
    • (2001) Proc. SI IEEE ECTC , pp. 141-148
    • Chandrasekhar, A.1    Vandevelde, B.2    Driessens, E.3    Pieters, P.4    Beyne, E.5    De Raedt, W.6    Nauwelaers, B.7    Van Puymbroeck, J.8
  • 7
    • 0002083650 scopus 로고    scopus 로고
    • Multi-layer thin-film mcm-d for the integration of high performance wireless front-end systems
    • Feb
    • G. Carchon, P. Pieters, K. Vaesen. W. De Raedt, B. Nauwelaers and E. Beyne, "Multi-Layer Thin-Film MCM-D for the Integration of High Performance Wireless Front-end Systems", Microwave Journal, Vol. 44, Issue 2, pp. 96-1 10, Feb 2001.
    • (2001) Microwave Journal , vol.44 , Issue.2 , pp. 96-110
    • Carchon, G.1    Pieters, P.2    Vaesen, K.W.D.R.3    Nauwelaers, B.4    Beyne, E.5
  • 8
    • 0036287632 scopus 로고    scopus 로고
    • Accurate rf electrical characterisation of csps using mcm-d thin film technology
    • San Diego, CA, USA, May 28-31
    • A. Chandrasekhar, E. Beyne, W. De Raedt and B. Nauwelaers "Accurate RF Electrical Characterisation of CSPs Using MCM-D Thin Film Technology", Proc. 52nd IEEE ECTC, San Diego, CA, USA, May 28-31, pp. 70-78.2002.
    • (2002) Proc. 52nd IEEE ECTC , pp. 70-78
    • Chandrasekhar, A.1    Beyne, E.2    De Raedt, W.3    Nauwelaers, B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.