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Volumn 45, Issue 10 PART 2, 1997, Pages 1948-1954

Development of microwave package models utilizing on-wafer characterization techniques

Author keywords

Calibration; Mmic package; Package modeling

Indexed keywords

CALIBRATION; FREQUENCY RESPONSE; MATHEMATICAL MODELS; MICROWAVE CIRCUITS; MONOLITHIC INTEGRATED CIRCUITS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; WAVEGUIDES;

EID: 0031249821     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.641800     Document Type: Article
Times cited : (24)

References (8)
  • 5
    • 0030148985 scopus 로고    scopus 로고
    • May 1996.
    • "An experimental technique for full package inductance matrix characterization," IEEE Trans. Comp., Packag., Manufact. Technol. B, vol. 19, pp. 338-343, May 1996.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.