메뉴 건너뛰기




Volumn 56, Issue 14, 2003, Pages 2199-2211

Failure analysis of solder joints with a damage-coupled viscoplastic model

Author keywords

Damage; Finite element algorithm; Solder joint; Viscoplasticity

Indexed keywords

ELASTOPLASTICITY; FAILURE ANALYSIS; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; VISCOPLASTICITY;

EID: 0037654862     PISSN: 00295981     EISSN: None     Source Type: Journal    
DOI: 10.1002/nme.660     Document Type: Article
Times cited : (13)

References (14)
  • 1
    • 0028404312 scopus 로고
    • Modeling complex inclastic deformation processes in IC packages' solder joints
    • ASME
    • Busso EP, Kitano M, Kumazawa T. Modeling complex inclastic deformation processes in IC packages' solder joints. Journal of Electronic Packaging (ASME) 1994; 116:6-15.
    • (1994) Journal of Electronic Packaging , vol.116 , pp. 6-15
    • Busso, E.P.1    Kitano, M.2    Kumazawa, T.3
  • 4
    • 0032292877 scopus 로고    scopus 로고
    • A thermodynamic framework for damage mechanics of solder joints
    • ASME
    • Basaran C, Yan CY. A thermodynamic framework for damage mechanics of solder joints. Journal of Electronic Packaging (ASME) 1998; 120:379-384.
    • (1998) Journal of Electronic Packaging , vol.120 , pp. 379-384
    • Basaran, C.1    Yan, C.Y.2
  • 9
    • 0343167484 scopus 로고    scopus 로고
    • Implementation of unified viscoplasticity with damage evolution and its application to electronic packaging
    • Qian Z, Liu S. Implementation of unified viscoplasticity with damage evolution and its application to electronic packaging. Advances in Electronic Packaging 1999; 26(2):2099-2106.
    • (1999) Advances in Electronic Packaging , vol.26 , Issue.2 , pp. 2099-2106
    • Qian, Z.1    Liu, S.2
  • 12
    • 0032027831 scopus 로고    scopus 로고
    • A finite element procedure of a cyclic thermoviscoplasticity model for solder and copper interconnects
    • ASME
    • Fu C, McDowell DL, Ume IC. A finite element procedure of a cyclic thermoviscoplasticity model for solder and copper interconnects. Journal of Electronic Packaging (ASME) 1998; 120:24-34.
    • (1998) Journal of Electronic Packaging , vol.120 , pp. 24-34
    • Fu, C.1    McDowell, D.L.2    Ume, I.C.3
  • 13
    • 0033221660 scopus 로고    scopus 로고
    • Coarsening of the Sn-Pb solder microstructure in constitutive model based prediction of solder joint thermal mechanical fatigue
    • Vianco PT, Burchett SN, Neilsen MK, Rejent JA, Frear DR. Coarsening of the Sn-Pb solder microstructure in constitutive model based prediction of solder joint thermal mechanical fatigue. Journal of Electronic Materials 1999; 28:1290-1298.
    • (1999) Journal of Electronic Materials , vol.28 , pp. 1290-1298
    • Vianco, P.T.1    Burchett, S.N.2    Neilsen, M.K.3    Rejent, J.A.4    Frear, D.R.5
  • 14
    • 4243243722 scopus 로고    scopus 로고
    • Equilibrium and virtual work
    • Hibbitt, Karlsson and Sorensen, Inc., version 5.8
    • Hibbitt, Karlsson & Sorensen, Inc., Equilibrium and virtual work, ABAQUS Theory Manual, version 5.8, 1998; 1.5.1.
    • (1998) ABAQUS Theory Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.