Physical and chemical changes in polystyrene during electron irradiation using EELS in the TEM: Contribution of the dielectric function

Journal of Microscopy

Volumn 191, Issue 2, 1998, Pages 187-194

  Varlot, K ^a   Martin, J M ^c   Quet, C ^b  

^a LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

^b ELF GRL BTE   (France)

^c NONE

Author keywords

Dielectric function; EELS; Irradiation damage; Polymers; PS; TEM

Indexed keywords

BOND STRENGTH (CHEMICAL); CARBON; DEGRADATION; ELECTRON ENERGY LEVELS; ELECTRON IRRADIATION; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; POLYSTYRENES; TRANSMISSION ELECTRON MICROSCOPY; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

ANALYTICAL TRANSMISSION ELECTRON MICROSCOPE; CHEMICAL CHANGE; DIELECTRIC FUNCTIONS; ELECTRON ENERGY-LOSS SPECTROSCOPIES; IRRADIATION DAMAGE; PHYSICAL CHANGES; SPECIMEN TEMPERATURE; SPECTRA'S; SUBMICROMETER SCALE; TEM;

ELECTRON ENERGY LOSS SPECTROSCOPY;

POLYSTYRENE;

ARTICLE; DIELECTRIC CONSTANT; ELECTRON BEAM; IRRADIATION; OPTICAL RESOLUTION; PRIORITY JOURNAL; RADIATION ABSORPTION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031847017     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1998.00376.x     Document Type: Article

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