Broadband determination of microwave permittivity and loss in tunable dielectric thin film materials

Materials Research Society Symposium - Proceedings

Volumn 603, Issue , 2000, Pages 253-264

  Booth, James C ^b   Vale, Leila R ^b   Ono, Ronald H ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; DIELECTRIC LOSSES; DIELECTRIC WAVEGUIDES; ELECTRIC CONDUCTANCE; FREQUENCIES; PERMITTIVITY MEASUREMENT; THIN FILMS;

BARIUM STRONTIUM TITANATE; MICROWAVE PERMITTIVITY;

DIELECTRIC MATERIALS;

EID: 0033710302     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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