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Volumn 76, Issue 9, 2000, Pages 1182-1184
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Dc-electric-field-induced microwave loss in ferroelectrics and intrinsic limitation for the quality factor of a tunable component
a
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000679556
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.125976 Document Type: Article |
Times cited : (64)
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References (17)
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