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Volumn 88, Issue 4, 2002, Pages 468051-468054
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Ultrathin aluminum oxide tunnel barriers
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINA;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRON EMISSION;
ELECTRON MICROSCOPY;
ELECTRON TRANSITIONS;
ELECTRON TUNNELING;
ELECTRONIC DENSITY OF STATES;
ELECTRONIC PROPERTIES;
MAGNETORESISTANCE;
OXIDATION;
SCANNING TUNNELING MICROSCOPY;
SCHOTTKY BARRIER DIODES;
ULTRATHIN FILMS;
BALLISTIC ELECTRON EMISSION MICROSCOPY (BEEM);
TUNNEL JUNCTIONS;
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EID: 0037185376
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (83)
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References (19)
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