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Volumn 88, Issue 4, 2002, Pages 468051-468054

Ultrathin aluminum oxide tunnel barriers

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRON TRANSITIONS; ELECTRON TUNNELING; ELECTRONIC DENSITY OF STATES; ELECTRONIC PROPERTIES; MAGNETORESISTANCE; OXIDATION; SCANNING TUNNELING MICROSCOPY; SCHOTTKY BARRIER DIODES; ULTRATHIN FILMS;

EID: 0037185376     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (83)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.