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Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 309, Issue 1-2, 2003, Pages 114-120

Temperature dependence of interface barrier height change as implicated by field emission studies of aligned-multiwall carbon nanotubes

(2) Chen, Sheng Yuan a Lue, Juh Tzeng a

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

Author keywords

Field emission; Multiwalled carbon nanotube

Indexed keywords

AMORPHOUS CARBON; ASPECT RATIO; ELECTRON AFFINITY; ELECTRON TUNNELING; FIELD EMISSION; NANOTUBES; TEMPERATURE DISTRIBUTION; THERMIONIC EMISSION;

CHARACTERISTIC CURVE; FIELD EMISSION CURRENTS; FIELD EMISSION MECHANISM; FOWLER-NORDHEIM THEORY; MULTI-WALLED NANOTUBES; TEMPERATURE DEPENDENCE; TEMPERATURE INCREASE; TEMPERATURE VARIATION;

MULTIWALLED CARBON NANOTUBES (MWCN);

CARBON;

ARTICLE; ELECTRON; ELECTRON TRANSPORT; ENERGY; FIELD EMISSION; HEIGHT; HIGH TEMPERATURE; NANOTECHNOLOGY; TEMPERATURE DEPENDENCE; THEORY; THERMAL ANALYSIS; TUBE;

EID: 0037451078 PISSN: 03759601 EISSN: None Source Type: Journal
DOI: 10.1016/S0375-9601(03)00161-0 Document Type: Article

Times cited : (20)

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