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Volumn 12, Issue 1, 1999, Pages 567-572
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Structural measurements for single-wall carbon nanotubes by Raman scattering technique
b
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
ELECTRIC CURRENTS;
ELECTRON EMISSION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
RAMAN SCATTERING;
RESONANCE;
SINGLE WALL CARBON NANOTUBES;
THERMO INDUCED RESONANCE;
NANOSTRUCTURED MATERIALS;
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EID: 0032593226
PISSN: 09659773
EISSN: None
Source Type: Journal
DOI: 10.1016/S0965-9773(99)00185-3 Document Type: Article |
Times cited : (59)
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References (9)
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