Scanned-probe field-emission studies of vertically aligned carbon nanofibers

Journal of Applied Physics

Volumn 89, Issue 3, 2001, Pages 1933-1937

  Merkulov, Vladimir I ^a   Lowndes, Douglas H ^a   Baylor, Larry R ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000014185     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1339860     Document Type: Article

References (17)

1. F. S. Baker, A. R. Osborn, and J. Williams, J. Phys. D 7, 2105 (1974).
2. J.-M. Bonard, J.-P. Salvetat, T. Stockli, L. Forro, and A. Chatelain, Appl. Phys. A: Mater. Sci. Process. 69, 245 (1999).
3. W. Zhu, C. Bower, O. Zhou, G. Kochanski, and S. Jin, Appl. Phys. Lett. 75, 873 (1999).
4. W. B. Choi et al., Appl. Phys. Lett. 75, 3129 (1999).
5. Y. Saito, R. Mizushima, T. Tanaka, K. Tohji, K. Uchida, M. Yumura, and S. Uemura, Fullerene Sci. Technol. 7, 653 (1999).
6. Q. H. Wang, A. A. Setlur, J. M. Lauerhaas, J. Y. Dai, E. W. Seelig, and R. P. H. Chang, Appl. Phys. Lett. 72, 2912 (1998).
7. Z. F. Ren, Z. P. Huang, J. W. Xu, J. H. Wang, P. Bush, M. P. Siegal, and P. N. Provencio, Science 282, 1105 (1998).
8. V. I. Merkulov, D. H. Lowndes, Y. Y. Wei, G. Eres, and E. Voelkl, Appl. Phys. Lett. 76, 3555 (2000).
9. Z. F. Ren et al., Appl. Phys. Lett. 75, 1086 (1999).
10. C. A. Spindt, I. Brodie, L. Humphrey, and E. R. Westerberg, J. Appl. Phys. 47, 5248 (1976).
11. H. Murakami, M. Hirakawa, C. Tanaka, and H. Yamakawa, Appl. Phys. Lett. 76, 1776 (2000).
12. Y. Chen, D. T. Shaw, and L. Guo, Appl. Phys. Lett. 76, 2469 (2000).
13. J. W. Gadzuk and E. W. Plummer, Rev. Mod. Phys. 45, 487 (1973).
14. L. Nilsson et al., Appl. Phys. Lett. 76, 2071 (2000).
15. G. Mesa, E. Dobado-Fuentes, and J. J. Saenz, J. Appl. Phys. 79, 39 (1996).
16. K. A. Dean, O. Groening, O. M. Kuttel, and L. Schlapbach, Appl. Phys. Lett. 75, 2773 (1999).
17. A. M. Rao, D. Jacques, R. C. Haddon, W. Zhu, C. Bower, and S. Jim, Appl. Phys. Lett. 76, 3813 (2000).