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Volumn 93, Issue 6, 2003, Pages 3198-3206

Numerical modeling of capacitively coupled hydrogen plasmas: Effects of frequency and pressure

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COMPUTATIONAL FLUID DYNAMICS; DEPOSITION; ELECTRIC DISCHARGES; MATHEMATICAL MODELS; PRESSURE EFFECTS; SILICON;

EID: 0037445037     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1555678     Document Type: Article
Times cited : (63)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.