The influence of firing temperature on the electrical and microstructural characteristics of thick-film resistors for strain gauge applications

Sensors and Actuators, A: Physical

Volumn 103, Issue 3, 2003, Pages 341-352

  Hrovat, Marko ^a   Benčan, Andreja ^a   Belavič, Darko ^a,b   Holc, Janez ^a   Dražič, Goran ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b HIPOT R and D   (Slovenia)

Author keywords

Electrical properties; Gauge factor; Microstructure; Thick film resistor

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; FIRING (OF MATERIALS); MICROSTRUCTURE; RESISTORS; RUTHENIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; STRAIN GAGES; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

THICK-FILM RESISTORS;

THICK FILM DEVICES;

EID: 0037442541     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(02)00402-8     Document Type: Article

References (25)

1. J.W. Pierce, D.W. Kuty, J.L. Larry, The chemistry and stability of ruthenium-based resistors, Solid State Technol. 25 (10) (1982) 85-93.
2. R.W. Vest, Materials science of thick-film technology, Ceram. Bull. 65 (4) (1986) 631-636.
3. 2 thick-film resistors, Active and Passive Elect. Comp. 12 (3) (1987) 155-166.
4. 2 thick-film resistors-relation between the electrical properties and particle size of constituents, the physical properties of glass and firing temperature, Active and Passive Elect. Comp. 13 (2) (1988) 76-83.
5. M. Prudenziati, B. Morten, A. Maseoro, Excess noise and refiring processes in thick-film resistors, J. Phys. D, Appl. Phys. 14 (7) (1981) 1355-1362.
6. T. Yamaguchi, S. Kato, Evaluation of commercial 96% alumina substrates and mechanism of paste-substrate interaction, Ceram. Trans. 15 (1990) 575-582.
7. B. Morten, A. Masoero, M. Prudenziati, T. Manfredini, Evolution of ruthenate-based thick-film cermet resistors, J. Phys. D, Appl. Phys. 27 (10) (1994) 2227-2235.
8. K. Adachi, S. Iida, K. Hayashi, Ruthenium clusters in lead-borosilicate glass in thick-film resistors, J. Mater. Res. 9 (7) (1994) 1866-1878.
9. K. Hoffman, An Introduction to Measurements Using Strain Gauges, Hottinger Baldwin Messtechnik GmbH, Darmstadt, 1989, pp. 19-28.
10. N. White, A. Cranny, Design and fabrication of thick-film sensors, Hybrid Circuits 12 (1987) 32-35.
11. N.M. White, J.D. Turner, Thick-film sensors: past, present and future, Meas. Sci. Technol. 8 (1) (1997) 1-20.
12. A. Cattaneo, R. Dell Acqua, G. Dell Orto, L. Pirozzi, C. Canali, A practical utilization of the piezoresistive effect in thick-film resistors: a low cost pressure sensor, in: Proceedings of the 1980 International Symposium on Microelectronics ISHM-80, New York, 1980, pp. 221-227.
13. C. Canali, D. Malavasi, B. Morten, M. Prudenziati, A. Taroni, Piezoresistive effects in thick-film resistors, J. Appl. Phys. 51 (6) (1980) 3282-3288.
14. M. Prudenziati, B. Morten, Piezoresistive properties of thick-film resistors an overview, Hybrid Circuits 10 (1986) 20-23, 37.
15. M. Hrovat, G. Dražič, J. Holc, D. Belavič, Correlation between microstructure and gauge factors of thick-film resistors, J. Mater. Sci. Lett. 14 (15) (1995) 1048-1051.
16. 2 grain size, Sens. Actuators A-58 (1997) 159-164.
17. M. Hrovat, D. Belavič, Z. Samardžija, J. Holc, A characterisation of thick-film resistors for strain gauge applications, J. Mater. Sci. 36 (11) (2001) 2679-2689.
18. M. Hrovat, Z. Samardžija, J. Holc, D. Belavič, Microstructural and electrical characteristics of some overfired thick-film resistors, J. Mater. Sci. Lett. 20 (4) (2001) 347-351.
19. M. Hrovat, S. Belavič, J. Holc, S. Šoba, An evaluation of some commercial thick-film resistors for strain gauges, J. Mater. Sci. Lett. 13 (1994) 992-995.
20. J.S. Shah, Strain sensitivity of thick-film resistors, IEEE Trans. Components, Hybrids and Manufact. Technol. CHMT-3 (4) (1980) 554-564.
21. K. Adachi, H. Kuno, Effect of glass composition on the electrical properties of thick-film resistors, J. Am. Ceram. Soc. 83 (10) (2000) 2441-2448.
22. M. Hrovat, D. Belavič, Z. Samardžija, Temperature sensors made by combinations of some standard thick-film materials, J. Mater. Sci. Lett. 19 (8) (2000) 651-655.
23. P.R. van Loan, Conductive ternary oxides of ruthenium, and their use in thick-film resistor glazes, Ceram. Bull., 51 (3) (1972) 231-233, 242.
24. J.C. Jiang, G.M. Crosbie, W. Tian, K.K. Cameron, X.Q. Pan, Transmission electron microscopy structure and platinum-like temperature coefficient of resistance in ruthenate-based thick-film resistor with copper oxide, J. Appl. Phys. 88 (2) (2000) 1124-1128.
25. N. Fawcett, M. Hill, The electrical response of thick-film resistors to hydrostatic pressure and uniaxial stress between 77 and 535 K, Sens. Actuators A, Phys. 78 (2-3) (1999) 114-119.