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Volumn 20, Issue 4, 2001, Pages 347-351
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Microstructural and electrical characteristics of some "overfired" thick-film resistors
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINA;
DIFFRACTOMETERS;
ELECTRIC CONDUCTIVITY MEASUREMENT;
EPOXY RESINS;
HIGH TEMPERATURE OPERATIONS;
MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
THICK FILMS;
X RAY DIFFRACTION ANALYSIS;
CONDUCTIVE PHASE;
MICROSTRUCTURAL ANALYSIS;
THICK FILM RESISTORS;
X RAY DIFFRACTOMETER;
RESISTORS;
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EID: 0035864553
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1006798006010 Document Type: Article |
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Times cited : (18)
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References (21)
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