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Journal of Materials Science

Volumn 36, Issue 11, 2001, Pages 2679-2689

A characterisation of thick film resistors for strain gauge applications

(4) Hrovat, Marko a Belavič, Darko b Samardžija, Zoran a Holc, Janez a

a JO EF STEFAN INSTITUTE (Slovenia)

b HIPOT (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPOSITION; CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY; SHEET METAL; STRAIN GAGES; THERMAL EFFECTS; THICK FILMS;

GAUGE FACTORS (GF); NOISE INDICES;

RESISTORS;

EID: 0035364951 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1017908728642 Document Type: Article

Times cited : (42)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.