Transmission electron microscopy structure and platinum-like temperature coefficient of resistance in a ruthenate-based thick film resistor with copper oxide

Journal of Applied Physics

Volumn 88, Issue 2, 2000, Pages 1124-1128

  Jiang, J C ^a,c   Crosbie, Gary M ^b   Tian, W ^a   Cameron, K K ^b,d   Pan, X Q ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b FORD MOTOR COMPANY   (United States)

^c Louisiana State University   (United States)

^d Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013368497     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373786     Document Type: Article

References (16)

1. T. Pfeiffer and R. J. Bouchard, Ceram. Mater. 33, 405 (1993).
2. G. M. Crosbie, F. Johnson, and W. Trela, J. Appl. Phys. 84, 2913 (1998).
3. F. Johnson, G. M. Crosbie, and W. T. Donlon, J. Mater. Sci.: Mater. Electron. 8, 29 (1997).
4. H. Arima, in Thick Film Sensors, edited by M. Prudenziati (Handbook of Sensors and Actuators (Elsevier, Amsterdam 1994), Vol. 1, pp. 127-150.
5. H.-G. Burckhardt, F. Gora, K.-H. Guldner, J. Dehoust, C. Modes, J. Schmidt, R. Kiemel, and S. Kemmler-Sack, U.S. Patent No. 5,244,601 (14 September 1993).
6. J. Hormadaly, S. J. Horowitz, J. R. Larry, and P. O'Callaghan, in MCM-C/Mixed Technologies and Thick Film Sensors, edited by W. K. Jones et al. (NATO ASI Series 3, No. 2 (Kluwer Academic, Dordrecht, 1995), pp. 259-265.
7. J. Hormadaly, J. R. Larry, and S. Mergui, in Multichip Modules with Integrated Sensors, edited by W. Kinzy Jones and Gábor Harsányi (NATO ASI Series 3, No. 16 (Kluwer Academic, Dordrecht, 1996), pp. 163-172.
8. J. Hormadaly, U.S. Patent No. 4,906,406 (6 March 1990).
9. J. Hormadaly, U.S. Patent No. 4,961,999 (9 October 1990).
10. T. Yamaguchi and K. Tanai, Proc. SPIE 1847, 463 (1992).
11. P. Hartman and W. G. Perdok, Acta Crystallogr. 8, 49 (1955).
12. V. M. Goldschmidt, Skrifter Norske Videnskaps-Akad. Oslo I. Mat.-Naturv. Kl. No. 1 (1926).
13. G. Tunell, E. Posnjak, and C. J. Ksanda, J. Wash. Acad. Sci. 23, 195 (1933).
14. G. E. Pike and C. H. Seager, J. Appl. Phys. 48, 5152 (1977).
15. A. T. Walker, L. A. Silverman, K. W. Hang, T. Pfeiffer, V. P. Siuta, L. H. Slack, and R. J. Bouchard, Proc. SPIE 2105, 695 (1993).
16. K. Adachi and H. Kuno, J. Am. Ceram. Soc. 80, 1055 (1997).