High-resolution imaging of ionic domains and crystal morphology in ionomers using AFM techniques

Macromolecules

Volumn 33, Issue 17, 2000, Pages 6541-6550

  McLean, R Scott ^a   Doyle, Marc ^a   Sauer, Bryan B ^a  

^a DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ION EXCHANGE MEMBRANES; SURFACE STRUCTURE;

FLUOROPOLYMER CRYSTALS; IONIC DOMAINS; OSCILLATION AMPLITUDES;

IONOMERS;

EID: 0034702671     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma000464h     Document Type: Article

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