Determination of interface energy band diagram between (100)Si and mixed Al-Hf oxides using internal electron photoemission

Applied Physics Letters

Volumn 82, Issue 2, 2003, Pages 245-247

  Afanas'ev, V V ^a   Stesmans, A ^a   Tsai, W ^b  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; MOS DEVICES; SILICON COMPOUNDS;

MIXED OXIDES;

INTERFACIAL ENERGY;

EID: 0037434195     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1532550     Document Type: Article

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