Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography

Journal of Crystal Growth

Volumn 252, Issue 1-3, 2003, Pages 113-119

  Chen, W M ^a   McNally, P J ^a   Shvyd'ko, Yu V ^b   Tuomi, T ^c   Danilewsky, A N ^d   Lerche, M ^b  

^a DUBLIN CITY UNIVERSITY   (Ireland)

^b UNIVERSITY OF HAMBURG   (Germany)

^c AALTO UNIVERSITY   (Finland)

^d NONE

Author keywords

A1. Burgers vector; A1. Dislocation; A1. X ray topography; A2. Heat exchanger method; B1. Sapphire

Indexed keywords

DISLOCATIONS (CRYSTALS); HEAT EXCHANGERS; VECTORS; X RAY ANALYSIS;

HEAT-EXCHANGER METHOD;

SAPPHIRE;

EID: 0037401377     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)00884-4     Document Type: Article

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