Atomic force microscope observations of domains in fine-grained bulk lead zirconate titanate ceramics

Smart Materials and Structures

Volumn 12, Issue 2, 2003, Pages 217-222

  Wang, Zuoyi ^a   Blendell, John E ^b   White, Grady S ^b   Jiang, Qing ^a  

^a University of California Riverside   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; ETCHING; MORPHOLOGY; PIEZOELECTRIC MATERIALS; TRANSDUCERS;

ELECTRIC FATIGUE;

CERAMIC MATERIALS;

EID: 0037395782     PISSN: 09641726     EISSN: None     Source Type: Journal    
DOI: 10.1088/0964-1726/12/2/309     Document Type: Article

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