Modelling the unmodellable: Algorithmic fault diagnosis

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 931-

  Aitken, Robert C ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRIC FAULT CURRENTS; FAILURE ANALYSIS; MATHEMATICAL MODELS; PRINTED CIRCUIT TESTING;

ALGORITHMIC FAULT DIAGNOSIS; FAULT MODELS;

INTEGRATED CIRCUIT TESTING;

EID: 0030409794     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)