Testing and diagnosis methodologies for embedded content addressable memories

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 19, Issue 2, 2003, Pages 207-215

  Li, Jin Fu ^a   Tzeng, Ruey Shing ^b   Wu, Cheng Wen ^b  

^a NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

BIST; CAM; March test algorithm; Memory diagnostics; Memory testing

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; COMPUTATIONAL COMPLEXITY; DESIGN FOR TESTABILITY; EMBEDDED SYSTEMS; FAILURE ANALYSIS; RANDOM ACCESS STORAGE; REQUIREMENTS ENGINEERING;

CONTENT ADDRESSABLE MEMORY; EMBEDDED MEMORY; MARCH TEST ALGORITHM; MEMORY TESTING; READ WRITE OPERATIONS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0037378654     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022858128485     Document Type: Article

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