Crystallogeometry of polymorphic transitions in silicon under pressure

High Pressure Research

Volumn 15, Issue 1, 1996, Pages 31-42

  Blank, V D ^a   Kulnitskiy, B A ^a  

^a INSTITUTE OF SPECTROSCOPY   (Russian Federation)

Author keywords

Electron microscopy; High pressure; Orientation relationships; Phase diagram; Shear deformation; Silicon

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; HIGH PRESSURE EFFECTS; MELTING; PHASE DIAGRAMS; SEMICONDUCTING SILICON; SHEAR DEFORMATION; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLOGEOMETRY; ORIENTATION RELATIONSHIPS; POLYMORPHIC TRANSITIONS;

PHASE TRANSITIONS;

EID: 0030368245     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: 10.1080/08957959608240458     Document Type: Article

References (9)

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9. T. Y. Tan, H. Föll and S. M. Hu, On the Diamond-cubic to Hexagonal Phase Transformation in Silicon, Phil. Mag. A, 44, 127 (1981).