Consistent, combined quantitative Auger electron spectroscopy and X-ray photoelectron spectroscopy digital databases: Convergence of theory and experiment

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 18, Issue 4 I, 2000, Pages 1083-1088

  Seah, M P ^a   Gilmore, I S ^a   Spencer, S J ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DATABASE SYSTEMS; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; IONIZATION OF SOLIDS; PHOTOIONIZATION; SENSITIVITY ANALYSIS; SPECTROMETERS; X RAY PHOTOELECTRON SPECTROSCOPY;

REFLECTED ELECTRON ENERGY LOSS SPECTROSCOPY (REELS);

SURFACE CHEMISTRY;

EID: 0034227930     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582304     Document Type: Article

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